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  Datasheet File OCR Text:
  TVR1B,tvr1g,tvr1j 2002-09-18 1 toshiba fast recovery diode silicon diffused type TVR1B,tvr1g,tvr1j tv applications (fast recovery)  average forward current: i f (av) = 0.5 a (ta = 65c)  repetitive peak reverse voltage: v rrm = 100, 400, 600 v  reverse recovery time: t rr = 2.0 s maximum ratings (ta     25c) characteristics symbol rating unit TVR1B 100 tvr1g 400 repetitive peak reverse voltage tvr1j v rrm 600 v average forward current (ta  65c) i f (av) 0.5 a peak one cycle surge forward current (non repetitive) i fsm 10 (50 hz) a junction temperature t j  40~125 c storage temperature range t stg  40~125 c electrical characteristics (ta     25c) characteristics symbol test condition min typ. max unit peak forward voltage v fm i fm  0.5 a   1.2 v repetitive peak reverse current i rrm v rrm  rated   10  a t rr (1) i f  20 ma, i r  1 ma   2.0 reverse recovery time t rr (2) i f  100 ma, i r  100 ma  0.3   s marking unit: mm jedec D jeita D toshiba 3-3c1a weight: 0.3 g (typ.) code type vr1b TVR1B vr1g tvr1g vr1j tvr1j type code lot no. cathode mark color: silver v r 1 j month of manufac- ture january to december are denoted by letter a to l res p ectivel y . year of manufac- ture last decimal digit of the year of manufacture
TVR1B,tvr1g,tvr1j 2002-09-18 2 i f ? v f surge forward current (non-repetitive) average forward current i f (av) (a) ta m ax ? i f (av) number of cycles at 50 hz and 60 hz peak surge forward current i fsm (a) instantaneous on-state current i f (a) instantaneous forward voltage v f (v) maximum allowable ambient temperature ta m a x ( c ) 1 100 10 0 6 10 12 2 8 tj  25c 4 3 5 30 50 60 hz 50 hz 0.4 0.8 0.1 1 20 1.2 1.6 2.0 2.4 2.8 0.3 0.5 3 5 10 t j  25c 125c 200 0 0 160 120 80 40 0.1 0.2 0.3 0.4 0.5 0.6 resistive and inductive load capacitive load
TVR1B,tvr1g,tvr1j 2002-09-18 3  toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc..  the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk.  the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others.  the information contained herein is subject to change without notice. 000707ea a restrictions on product use


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